Absolute Pulling Range (APR)
A VCXO is a crystal oscillator where its output frequency changes in direct proportion to the application of an input control voltage. There are many names...
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Engineer’s Guide to 5G Semiconductor Test
This Whitpaper paper focuses on the new challenges of testing semiconductor devices for wideband 5G applications.The enhanced mobile...
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Published: Jun 15, 2022
Improving The Capabilities Of Cognitive Radar & EW Systems
In this publication we will review the challenges that mode-agile (WARM) radar and EW threat emitters pose to traditional static threat library implementations...
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5G mmWave Semiconductor Device Test
To achieve some of the ambitious Key Performance Indicators of 5G enhanced Mobile Broadband, semiconductor devices for 5G infrastructure need to empower...
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Published: May 19, 2022
Advanced Probing In DDR3/DDR4 Memory Designs
For reliable and efficient system verification and debug of DDR3/DDR4 memory designs, comprehensive compliance test and analysis tools are required. While...
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Published: Dec 17, 2021
From Design To Real RF Device - Connecting EDA Simulation And Hardware Testing
This webinar is intended for engineers who design RF components and systems using tools for simulation and hardware test. We will be introducing a new...
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Test Engineering Insights for Aerospace and Defense
Whether you’re putting pencil to paper for your next program bid, assessing the mass-migration costs to move your teams and testers to Windows 10,...
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Advanced Driver Assistance Systems - Test Solutions
As advanced driver assistance systems (ADAS) introduce
new technology into vehicles, they need adaptable, futureproof test systems. NI offers a single,...
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The Ultimate Guide to Managing Obsolescence in Aerospace and Defense
Test engineers spend as much as 50 percent of their time (or even more in some cases) actively dealing with obsolescence in their test program sets. ...
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Electronic Design Security Aspects & Challenges
Adding security to a device costs extra money, time, power consumption and makes everything worse. The only reason for adding security to a device is the...
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Selecting an Approach to Build Flexible, Cost-Effective ECU Production Test Systems
ECUs became a standard component in most vehicles. As a computer designed to solve a very specific problem, the ECU is a fundamental component...
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The Ultimate Guide to ECU Production Test Systems
Modern vehicles can contain over 100 ECUs controlling everything from the drivetrain to the ADAS systems. Each ECU needs to be tested individually as well...
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dB or not dB?
True or false: 30 dBm + 30 dBm = 60 dBm? Why does 1% work out to be -40 dB one time but then 0.1 dB or 0.05 dB the next time? These questions sometimes...
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Key Considerations for Powertrain HIL Test
Safety, availability, and cost considerations can make performing thorough tests of embedded control devices using the complete system impractical....
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